Investigation of undesired ripple voltage across power source side and solutions in military low-frequency immunity tests

dc.authorscopusid24483177900
dc.authorscopusid56406209900
dc.authorscopusid57190873955
dc.authorscopusid6506066513
dc.authorscopusid25651421600
dc.contributor.authorCakir, S.
dc.contributor.authorSen, O.
dc.contributor.authorOzturk, M.
dc.contributor.authorCelep, M.
dc.contributor.authorAcarer, T.
dc.date.accessioned2024-07-18T20:17:11Z
dc.date.available2024-07-18T20:17:11Z
dc.date.issued2019
dc.description.abstractThe MIL-STD-461 CS101 test is one of the essential low-frequency conducted immunity tests for military and aerospace equipment, however it includes some challenges in application. The major challenge is the necessity for the measurement of injected CS101 ripples under the power frequency of the EUT. The measurement of CS101 ripples on the power frequency is almost impossible without taking some extra precautions. In addition to the hard necessity of measuring the CS101 ripple voltage induced across the EUT power input, the other challenge of measuring the ripple voltage that drops across the power source side under the AC power frequency of the EUT is now required by MIL-STD-461G, which aggravates the severe CS101 test conditions of AC devices. In this paper, we propose a FFT-based time domain solution and a method to instantly check the ripple voltage that drops across the power source side, in other words across the 10 ?F test capacitor, during the test under the AC EUT power frequency and to verify that it is low enough and not affecting the reliability of the test. The method proposed in this paper significantly overcomes the CS101 test challenges and makes CS101 test results more accurate. In this paper, we also extensively focused on effective solutions to reduce the ripple voltage induced across the power source side along with measurement uncertainty analysis. © 2012 IEEE.en_US
dc.identifier.doi10.1109/MEMC.2019.8878239
dc.identifier.endpage73en_US
dc.identifier.issn2162-2264
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-85074339821en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage65en_US
dc.identifier.urihttps://doi.org/10.1109/MEMC.2019.8878239
dc.identifier.urihttps://hdl.handle.net/11411/6427
dc.identifier.volume8en_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartofIEEE Electromagnetic Compatibility Magazineen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAerospaceen_US
dc.subjectCapacitoren_US
dc.subjectCs101en_US
dc.subjectDften_US
dc.subjectEmcen_US
dc.subjectFften_US
dc.subjectImmunityen_US
dc.subjectMilitaryen_US
dc.subjectSusceptibilityen_US
dc.subjectTime Domainen_US
dc.subjectCapacitorsen_US
dc.subjectDesign For Testabilityen_US
dc.subjectDropsen_US
dc.subjectElectromagnetic Compatibilityen_US
dc.subjectFast Fourier Transformsen_US
dc.subjectMagnetic Susceptibilityen_US
dc.subjectTime Domain Analysisen_US
dc.subjectUncertainty Analysisen_US
dc.subjectAerospaceen_US
dc.subjectCs101en_US
dc.subjectImmunityen_US
dc.subjectMilitaryen_US
dc.subjectTime Domainen_US
dc.subjectElectronic Equipment Testingen_US
dc.titleInvestigation of undesired ripple voltage across power source side and solutions in military low-frequency immunity testsen_US
dc.typeArticleen_US

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